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RIGOL Waveform Generator DG5352 Pro
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RIGOL Waveform Generator DG5352 Pro
Dual-channel output, isolated from the ground；arbitrary waveform generator with 350 MHz bandwidth,2.5 GSa/s and 64 Mpts（128Mpts opt.) memory,EU Cable
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about one month
• Dual-channel output, isolated from the ground
• Max. sample rate: 2.5 GSa/s
• Max. output frequency: 500 MHz
• 16-bit vertical resolution
• Square: 170 MHz max. frequency, 0.8 ns min. rise time
• Pulse: 120 MHz max. frequency, 4.2 ns min. pulse width
• Built-in high-order harmonic generator (max. 20th order)
• A maximum Arb waveform length of 64 Mpts/CH (128 Mpts/CH optional)
• Optional functions: Sequence, IQ, Multi-pulse, Pattern, Multi-tone
• Battery holder available to power the instrument, satisfying testing requirements in the field
• 10.1'' HD touch screen, allowing you to configure dual-channel waveforms together from a
single screen
• Standard Web Control function for easier remote cooperation
Dual-Channel Ground Isolation
Eliminates interference and noise caused by ground loops, enhancing output stability and protecting components and circuits are sensitive to potential differences.
High Sampling, Low Distortion
With a 2.5 GSa/s sampling rate and a maximum output frequency of 500 MHz, the DG5000 Pro provides stable assurance for your waveform outputs.
The DG5000 Pro series supports a 170 MHz square wave, with a rise time as fast as 0.8 ns (typical).
The DG5000 Pro series supports square wave frequencies up to 170 MHz, with a minimum rise time improved to 0.8 ns (typical). Performance is uncompromised, offering high-end configurations even at entry-level.
High-Fidelity Signal with Low Jitter
Utilizing RIGOL's Si-Fi II high-fidelity signal technology, jitter is reduced to as low as 200 ps. Point-by-point output ensures stable, non-fluctuating waveforms.
Custom Pattern Output
Providing a range of Pseudo Random Binary Sequence signals from PRBS2 to PRBS32, along with custom pattern output functionality at baud rates up to 300M, offers engineers direct assistance in verifying the performance of digital I/O interface receivers.
New Multi-Pulse Functionality
Supports editing of 2 to 16 pulses, ideal for quickly generating dual-pulse signals to drive components such as MOSFETs, IGBTs, and third-generation semiconductor power devices, enabling the testing of dynamic performance parameters of power devices.
512-Event Advanced Waveform Sequencing Capability
Transforms what previously required multiple repetitions of waveform construction and test environment setup into a single, comprehensive test case, saving users time and enhancing testing efficiency.
New Multi-Tone Modulation Functionality
It supports users in generating waveforms ranging from simple dual-tone to a maximum of 16 tones, with flexible editing of tone amplitude and phase, offering a more efficient and convenient testing method for evaluating the performance of devices such as amplifiers and filters.
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